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Progress in Transmission Electron Microscopy 2 : Applications in Materials Science - Ze Zhang
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Ze Zhang:

Progress in Transmission Electron Microscopy 2 : Applications in Materials Science - Paperback

2010, ISBN: 3642087183

[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg], Druck auf Anfrage Neuware - Printed after ordering - Transmission electron microscopy (TEM) is now recognized as a crucial… More...

NEW BOOK. Shipping costs:Versandkostenfrei. (EUR 0.00) AHA-BUCH GmbH, Einbeck, Germany [51283250] [Rating: 5 (von 5)]
2
Progress in Transmission Electron Microscopy 2 - Ze Zhang
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Ze Zhang:

Progress in Transmission Electron Microscopy 2 - Paperback

2010, ISBN: 3642087183

[EAN: 9783642087189], Neubuch, [PU: Springer Berlin Heidelberg Okt 2010], This item is printed on demand - it takes 3-4 days longer - Neuware -Transmission electron microscopy (TEM) is no… More...

NEW BOOK. Shipping costs:Versandkostenfrei. (EUR 0.00) BuchWeltWeit Inh. Ludwig Meier e.K., Bergisch Gladbach, Germany [57449362] [Rating: 5 (von 5)]
3
Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor
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Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor - new book

ISBN: 9783642087189

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many asp… More...

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4
Progress in Transmission Electron Microscopy 2 Applications in Materials Science - Zhang, Ze (Herausgeber); Zhang, Xiao-Feng (Herausgeber)
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Zhang, Ze (Herausgeber); Zhang, Xiao-Feng (Herausgeber):
Progress in Transmission Electron Microscopy 2 Applications in Materials Science - Paperback

2010, ISBN: 3642087183

Hardcover

Softcover reprint of hardcover 1st ed. 2001 Kartoniert / Broschiert Wissenschaftliche Standards, Normung usw., Nanotechnologie, Materialwissenschaft, mit Schutzumschlag 11, [PU:Springer… More...

Shipping costs:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien
5
Progress in Transmission Electron Microscopy 2 - Xiao-Feng Zhang; Ze Zhang
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Xiao-Feng Zhang; Ze Zhang:
Progress in Transmission Electron Microscopy 2 - First edition

2010, ISBN: 9783642087189

Paperback

Applications in Materials Science, Buch, Softcover, Softcover reprint of hardcover 1st ed. 2001, [PU: Springer Berlin], Springer Berlin, 2010

Shipping costs:Versand in 10-14 Tagen. (EUR 0.00)

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Bibliographic data of the best matching book

Details of the book
Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Details of the book - Progress in Transmission Electron Microscopy 2: Applications in Materials Science Xiao-Feng Zhang Editor


EAN (ISBN-13): 9783642087189
ISBN (ISBN-10): 3642087183
Hardcover
Paperback
Publishing year: 2010
Publisher: Springer Berlin Heidelberg Core >1 >T
328 Pages
Weight: 0,497 kg
Language: eng/Englisch

Book in our database since 2011-02-05T10:39:57+00:00 (London)
Detail page last modified on 2024-01-11T20:28:33+00:00 (London)
ISBN/EAN: 9783642087189

ISBN - alternate spelling:
3-642-08718-3, 978-3-642-08718-9
Alternate spelling and related search-keywords:
Book author: zhang xiao, zhang feng
Book title: progress materials science, transmission, electron microscopy, surface science series


Information from Publisher

Author: Xiao-Feng Zhang; Ze Zhang
Title: Springer Series in Surface Sciences; Progress in Transmission Electron Microscopy 2 - Applications in Materials Science
Publisher: Springer; Springer Berlin
307 Pages
Publishing year: 2010-10-19
Berlin; Heidelberg; DE
Printed / Made in
Language: English
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XIV, 307 p.

BC; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Materialwissenschaft; Verstehen; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Nanotechnology; Characterization and Analytical Technique; Wissenschaftliche Standards, Normung usw. Nanotechnologie; Werkstoffprüfung; BB

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Reviews the modern developments that have made transmission electron microscopy indispensible for materials research Includes supplementary material: sn.pub/extras

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