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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Adam Foster Author
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Adam Foster Author - new book

ISBN: 9780387400907

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writt… More...

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Adam Foster|Werner A. Hofer
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Adam Foster|Werner A. Hofer:

Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - hardcover

2006, ISBN: 0387400907

[EAN: 9780387400907], Neubuch, [PU: Springer New York], TECHNOLOGY & INDUSTRIAL ARTS SCIENCE ELECTRON MICROSCOPES MICROSCOPY ENGINEERING MATERIALS THIN FILMS, SURFACES INTERFACES NANOTECH… More...

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Scanning Probe Microscopy - Adam Foster Werner A. Hofer
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Adam Foster Werner A. Hofer:
Scanning Probe Microscopy - First edition

2006

ISBN: 9780387400907

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[ED: Gebunden], [PU: Springer New York], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Scanning Probe Microscopy provides a comprehe… More...

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Foster, Adam S.; Werner A. Hofer:
Scanning Probe Microscopy. Atomic Scale Engineering by Forces and Currents. - hardcover

2006, ISBN: 0387400907

[EAN: 9780387400907], [PU: New York, Springer.], WERKSTOFFTECHNIK, 116 figs., XIV, 281 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, dah… More...

Shipping costs: EUR 3.00 Antiquariat im Hufelandhaus GmbH vormals Lange & Springer, Berlin, Germany [2726420] [Rating: 5 (von 5)]
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Adam Foster/ Werner A. Hofer/ Andrew J. Fisher
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Adam Foster/ Werner A. Hofer/ Andrew J. Fisher:
Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents - Paperback

ISBN: 9780387400907

*Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents* - Atomic Scale Engineering by Forces and Currents / gebundene Ausgabe für 207.99 € / Aus dem Bereich: Bücher, … More...

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Adam Foster Author
Author:
Title:
ISBN:

9780387400907


Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today's research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Details of the book - Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Adam Foster Author


EAN (ISBN-13): 9780387400907
ISBN (ISBN-10): 0387400907
Hardcover
Paperback
Publishing year: 2006
Publisher: Springer New York Core >2 >T
281 Pages
Weight: 0,532 kg
Language: eng/Englisch

Book in our database since 2007-04-15T09:30:07+01:00 (London)
Detail page last modified on 2023-11-25T12:39:20+00:00 (London)
ISBN/EAN: 9780387400907

ISBN - alternate spelling:
0-387-40090-7, 978-0-387-40090-7
Alternate spelling and related search-keywords:
Book author: hofer werner, probe, werner adam, fisher, andrew foster, höfer werner, werner best, kantorovich, hofer leo
Book title: scanning probe microscopy, scales, scanning force microscopy

Information from Publisher

Author: Adam Foster; Werner A. Hofer
Title: NanoScience and Technology; Scanning Probe Microscopy - Atomic Scale Engineering by Forces and Currents
Publisher: Springer; Springer US
282 Pages
Publishing year: 2006-06-28
New York; NY; US
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
Available
XIV, 282 p.

BB; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; materials properties; microscopy; molecule; simulation; spectroscopy; Characterization and Analytical Technique; Nanotechnology; Surfaces, Interfaces and Thin Film; Atomic and Molecular Structure and Properties; Condensed Matter Physics; Spectroscopy; Nanotechnologie; Materialwissenschaft; Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; EA; BC

The Physics of Scanning Probe Microscopes.- SPM: The Instrument.- Theory of Forces.- Electron Transport Theory.- Transport in the Low Conductance Regime.- Bringing Theory to Experiment in SFM.- Topographic images.- Single-Molecule Chemistry.- Current and Force Spectroscopy.- Outlook.
Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy Provides a framework for linking scanning probe theory and simulations with experimental data Written in the style of a textbook with step-by-step examples of how theoretical concepts are used to generate state-of-the-art simulations

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