2010, ISBN: 0387981810
[EAN: 9780387981819], Neubuch, [PU: Springer New York Jul 2010], ELEKTRONENMIKROSKOPIE - RASTER-TUNNEL-MIKROSKOPIE; SPEKTROSKOPIE; SAMPLEPREPARATIONTECHNIQUEFORTEM; STRUCTUREANALYSIS; BIO… More...
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2010, ISBN: 0387981810
[EAN: 9780387981819], Neubuch, [SC: 0.0], [PU: Springer New York], ELEKTRONENMIKROSKOPIE - RASTER-TUNNEL-MIKROSKOPIE; SPEKTROSKOPIE; SAMPLEPREPARATIONTECHNIQUEFORTEM; STRUCTUREANALYSIS; B… More...
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2010, ISBN: 0387981810
2010 Gebundene Ausgabe Elektronenmikroskopie - Raster-Tunnel-Mikroskopie, Spektroskopie, Petrologie (Gesteinskunde), Petrografie und Mineralogie, Nanotechnologie, Werkstoffprüfung, Samp… More...
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Sample Preparation Handbook for Transmission Electron Microscopy: Vol.1 Sample Preparation Handbook for Transmission Electron Microscopy - new book
2010, ISBN: 0387981810
This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including tw… More...
Weltbild.de Nr. 22097851. Shipping costs:, 2-5 Werktage, DE. (EUR 0.00) Details... |
2010, ISBN: 9780387981819
Methodology, Buch, Hardcover, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
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2010, ISBN: 0387981810
[EAN: 9780387981819], Neubuch, [PU: Springer New York Jul 2010], ELEKTRONENMIKROSKOPIE - RASTER-TUNNEL-MIKROSKOPIE; SPEKTROSKOPIE; SAMPLEPREPARATIONTECHNIQUEFORTEM; STRUCTUREANALYSIS; BIO… More...
Jeanne Ayache:
Sample Preparation Handbook for Transmission Electron Microscopy : Methodology - hardcover2010, ISBN: 0387981810
[EAN: 9780387981819], Neubuch, [SC: 0.0], [PU: Springer New York], ELEKTRONENMIKROSKOPIE - RASTER-TUNNEL-MIKROSKOPIE; SPEKTROSKOPIE; SAMPLEPREPARATIONTECHNIQUEFORTEM; STRUCTUREANALYSIS; B… More...
2010
ISBN: 0387981810
2010 Gebundene Ausgabe Elektronenmikroskopie - Raster-Tunnel-Mikroskopie, Spektroskopie, Petrologie (Gesteinskunde), Petrografie und Mineralogie, Nanotechnologie, Werkstoffprüfung, Samp… More...
Sample Preparation Handbook for Transmission Electron Microscopy: Vol.1 Sample Preparation Handbook for Transmission Electron Microscopy - new book
2010, ISBN: 0387981810
This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including tw… More...
2010, ISBN: 9780387981819
Methodology, Buch, Hardcover, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2010
Bibliographic data of the best matching book
Details of the book - Sample Preparation Handbook for Transmission Electron Microscopy
EAN (ISBN-13): 9780387981819
ISBN (ISBN-10): 0387981810
Hardcover
Paperback
Publishing year: 2010
Publisher: Springer-Verlag New York Inc.
199 Pages
Weight: 0,550 kg
Language: eng/Englisch
Book in our database since 2008-06-12T09:05:46+01:00 (London)
Detail page last modified on 2023-09-28T03:08:29+01:00 (London)
ISBN/EAN: 9780387981819
ISBN - alternate spelling:
0-387-98181-0, 978-0-387-98181-9
Alternate spelling and related search-keywords:
Book author: ayache, ehret, luc, daniele, jacqueline, jacq, jacquelin, jacqu, bou, beau, ayach, gabriel laub, gabrielle, beaunier
Book title: electron, microscopy, transmission, methodology book, handbook sample preparation, jeanne
Information from Publisher
Author: Jeanne Ayache; Luc Beaunier; Jacqueline Boumendil; Gabrielle Ehret; Danièle Laub
Title: Sample Preparation Handbook for Transmission Electron Microscopy - Methodology
Publisher: Springer; Springer US
250 Pages
Publishing year: 2010-07-08
New York; NY; US
Printed / Made in
Weight: 1,250 kg
Language: English
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XXIII, 250 p.
BB; Characterization and Evaluation of Materials; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; Sample preparation technique for TEM; Structure analysis; biology; chemical analysis; electron microscopy; materials science; microscopy; sample preparation physics; spectroscopic analysis; thin slices protocols; transmission electron microscopy; Biological Microscopy; Biological Microscopy; Mineralogy; Nanotechnology; Characterization and Analytical Technique; Bioanalysis and Bioimaging; Mineralogy; Nanotechnology; Biophysik; Petrologie (Gesteinskunde), Petrografie und Mineralogie; Nanotechnologie; BC; EA
This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biological samples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy http://temsamprep.in2p3.fr/More/other books that might be very similar to this book
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