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1
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Kai-Hui Chang, Valeria Bertacco, Igor L. Markov
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Kai-Hui Chang, Valeria Bertacco, Igor L. Markov:

Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - new book

2010, ISBN: 9789048181124

Kartoniert, 224 Seiten, 235mm x 155mm x 13mm, Sprache(n): eng Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solu… More...

Shipping costs:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES Buch- und Medienhandel, 14621 Schönwalde-Glien
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Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters
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Functional Design Errors in Digital Circuits by Kai-hui Chang Paperback | Indigo Chapters - new book

ISBN: 9789048181124

Functional Design Errors in Digital Circuits Diagnosiscovers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Lev… More...

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3
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Chang, Kai-hui
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Chang, Kai-hui:
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32) - Paperback

2010

ISBN: 9789048181124

Mitwirkende: Markov, Igor L. Mitwirkende: Bertacco, Valeria, Springer, Taschenbuch, Auflage: Softcover reprint of hardcover 1st ed. 2009, 224 Seiten, Publiziert: 2010-10-28T00:00:01Z, Pro… More...

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Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.
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Chang, Kai-Hui; Bertacco, Valeria; Markov, Igor L.:
Functional Design Errors in Digital Circuits Diagnosis Correction and Repair - Paperback

2010, ISBN: 9048181127

Hardcover

Softcover reprint of hardcover 1st ed. 2009 Kartoniert / Broschiert Computer-Aided Design (CAD), Rechnerarchitektur und Logik-Entwurf, Automaticdebugging; Errordiagnosis; Errorrepair; P… More...

Shipping costs:Versandkostenfrei innerhalb der BRD. (EUR 0.00) MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien
5
Functional Design Errors in Digital Circuits - Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov
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Valeria Bertacco/ Kai-Hui Chang/ Igor L. Markov:
Functional Design Errors in Digital Circuits - Paperback

2009, ISBN: 9048181127

Hardcover

Functional Design Errors in Digital Circuits ab 149.99 € als Taschenbuch: Diagnosis Correction and Repair. Softcover reprint of hardcover 1st ed. 2009. Aus dem Bereich: Bücher, Taschenbüc… More...

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Details of the book
Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)

Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.

Details of the book - Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, Band 32)


EAN (ISBN-13): 9789048181124
ISBN (ISBN-10): 9048181127
Hardcover
Paperback
Publishing year: 2010
Publisher: Springer
224 Pages
Weight: 0,345 kg
Language: eng/Englisch

Book in our database since 2011-04-07T23:51:00+01:00 (London)
Detail page last modified on 2023-11-16T21:13:08+00:00 (London)
ISBN/EAN: 9789048181124

ISBN - alternate spelling:
90-481-8112-7, 978-90-481-8112-4
Alternate spelling and related search-keywords:
Book author: markov, chang, hui kai
Book title: error design, function circuits, electrical engineering, hui kai


Information from Publisher

Author: Kai-hui Chang; Igor L. Markov; Valeria Bertacco
Title: Lecture Notes in Electrical Engineering; Functional Design Errors in Digital Circuits - Diagnosis Correction and Repair
Publisher: Springer; Springer Netherland
200 Pages
Publishing year: 2010-10-28
Dordrecht; NL
Printed / Made in
Language: English
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXIV, 200 p.

BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Automatic debugging; Error diagnosis; Error repair; Post-silicon debugging; algorithms; circuit design; formal verification; integrated circuit; layout; simulation; verification; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Logic Design; Computer-Aided Design (CAD); Rechnerarchitektur und Logik-Entwurf; BB; EA

Background and Prior Art.- Current Landscape in Design and Verification.- Finding Bugs and Repairing Circuits.- FogClear Methodologies and Theoretical Advances in Error Repair.- Circuit Design and Verification Methodologies.- Counterexample-Guided Error-Repair Framework.- Signature-Based Resynthesis Techniques.- Symmetry-Based Rewiring.- FogClear Components.- Bug Trace Minimization.- Functional Error Diagnosis and Correction.- Incremental Verification for Physical Synthesis.- Post-Silicon Debugging and Layout Repair.- Methodologies for Spare-Cell Insertion.- Conclusions.
Coverage of novel techniques to automate IC debugging, a subject rarely covered in other books Comprehensive scope and solutions: from RTL to post-silicon debugging The innovative techniques covered in this book are recent and have been featured by MIT Technology Review, EE Times, SCD Source, IEEE Computer, and other sources First empirical comparison of several methods for spare-cell insertion A variety of examples and figures to illustrate key concepts and algorithms

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