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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - hardcover

2012, ISBN: 9783642297601

Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… More...

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - hardcover

2012, ISBN: 9783642297601

Springer, Gebundene Ausgabe, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 12.88 kg, Verkaufsrang: 2428090, Maschine… More...

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - hardcover

2012

ISBN: 9783642297601

Springer, Hardcover, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 28.4 kg, Verkaufsrang: 2466247, Maschinenbau, Ing… More...

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - hardcover

2012, ISBN: 9783642297601

Springer, Hardcover, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 28.4 kg, Verkaufsrang: 2466247, Maschinenbau, Ing… More...

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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - hardcover

2012, ISBN: 9783642297601

Springer, Hardcover, Auflage: 4th ed. 2013, 784 Seiten, Publiziert: 2012-10-14T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 28.4 kg, Verkaufsrang: 2466247, Maschinenbau, Ing… More...

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Details of the book
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Author:
Title:
ISBN:

3642297609


This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Details of the book - Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)


EAN (ISBN-13): 9783642297601
ISBN (ISBN-10): 3642297609
Hardcover
Publishing year: 2012
Publisher: Springer
761 Pages
Weight: 1,318 kg
Language: Englisch

Book in our database since 2009-04-07T21:49:51+01:00 (London)
Detail page last modified on 2024-03-26T23:48:37+00:00 (London)
ISBN/EAN: 3642297609

ISBN - alternate spelling:
3-642-29760-9, 978-3-642-29760-1
Alternate spelling and related search-keywords:
Book author: james, howe, jam, brent, fultz
Book title: texts and transmission, micro, electron microscopy materials, material, text and transmission, graduate texts physics

Information from Publisher

Author: Brent Fultz; James Howe
Title: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Publisher: Springer; Springer Berlin
764 Pages
Publishing year: 2012-10-14
Berlin; Heidelberg; DE
Printed / Made in
Language: English
128,39 € (DE)
131,99 € (AT)
142,00 CHF (CH)
POD
XX, 764 p.

BB; Hardcover, Softcover / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Physik; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC

Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.


New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras
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